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Machine Learning: A Strong Ally in the CT-Scan to FE-Model Journey

This presentation was made at the NAFEMS Nordic Conference which was held online on the 16th to the 17th of November 2020.

Document Details

ReferenceC_Nov_20_Nordic_7
AuthorBaksiova. E
LanguageEnglish
TypePresentation Recording
Date 16th November 2020
OrganisationBETA CAE Systems
RegionNordic

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